NACK Webinar Handout: Fundamentals of Metrology and Characterization for Nanotechnology

This webinar handout was made to accompany the webinar Fundamentals of Metrology and Characterization For Nanotechnology, presented by the Nanotechnology Applications and Career Knowledge (NACK) Network on September 27, 2013. In the webinar, Dr. Diane Hickey-Davis, a respected scientist and product expert, shared her knowledge of five common types of metrology equipment, how industry uses it in practice, and what students and technicians should know and be able to do when measuring on this scale. She describes how you know what you are looking at, reinforces the basic science concepts, and details the capabilities and limitations of the techniques. This handout provides the objectives of the webinar, as well as links to resources mentioned in the webinar.